一、主 题：Recent Trends in Reliability and Statistical Machine Learning
二、主讲人：美国罗格斯大学 Hoang Pham 教授
四、地 点：腾讯会议 会议 ID：230 487 702
We're living in an era of fast and unpredictable change. Billions of people are connected to each other through their mobile devices. Data is being collected and processed like never before. Automation, machine learning, cloud computing, AI, and Internet of Everything (IoE) — these are no longer revolutionary concepts, they are our reality. The Fourth Industrial Revolution (or Industry 4.0) will impact jobs, bring formidable challenges at the same time it will bring immense opportunities in many technical areas especially in IT computing skills, AI, robotics and analytics.
The era of big data through reliability and statistical machine computing with almost all applications has experienced a dramatic shift in the past two decades to a truly global industry. The forces that have driven this change are still at play and will continue. In this talk I will discuss: (1) recent trends in system reliability and maintenance modeling as well as criteria for model selection, and (2) statistical machine-learning results of various applications from distribution parameter prediction to breast cancer detection to the Covid-19 pandemic.
Dr. Hoang Pham is a Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey.He is a Fellow of the IEEE and IISE. Before joining Rutgers, he was a Senior Engineering Specialist with the Boeing Company and the Idaho National Engineering Laboratory. He has been served as Editor-in-Chief, Editor, Associate Editor, Guest Editor and board member of many journals and also the Editor of Springer Book Series in Reliability Engineering. He is the author or coauthor of 7 books and has published over 190 journal articles, 100 conference papers, and edited 15 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at many international conferences. His numerous awards include the 2009 IEEE Reliability Society Engineer of the Year Award.
编辑：林坤 / 审核：林坤 / 发布：陈伟